Most of the present instruments are based on commercially available instruments originally planned for threshold spectroscopy, i.e. those electrons from the surface which ovecome the workfunction threshold are used in an electron microscope column for 2D imaging. More elaborate instruments like the SPELEEM developed by Prof. Bauers group at the University of Clausthal in addition allow the combination with structural properties using the diffraction contrast in low-energy electron diffraction. All instruments presently have in common the limitations of spherical and chromatic aberrations which limit the resolution limit to about 10 nm.

In order to circumvent these limitations aberration correction is unavoidable. This is the goal of the present SMART spectromicroscopy project. Based on theoretical calculations performed by the group of Prof. Rose at the Technical Univ. of Darmstadt, an aberration-corrected spectromicroscope is presently installed at the BESSY-II synchrotron in Berlin aiming for

a lateral resolution of 2 nm,
an electron energy resolution of 0.1 eV, and
a photon energy resolution of E/DE > 10.000 at 400 eV

For further technical details and test experiments, see

• General overview over the  SMART spectromicroscope
• Operation as  UV-PEEM with lab source
• Operation as  XPEEM at BESSY-II
• Operation as energy-filtered XPEEM

Presently involved people:

Prof. Dr. E. Umbach (project coordinator)
Dr. Th. Schmidt
U. Groh

Prof. Dr. H.J.Freund
Prof. Dr. R. Schlögl
Dr. W. Engel (deceased on July 8, 2003)
H. Marchetto
A. Rahm
W. Erlebach
K. Ihmann

Prof. Dr. E. Bauer (presently at Arizona State Univ.)
Dr. G. Lilienkamp

Prof. Dr. H. Rose
Dr. R. Spehr

Prof. Dr. R. Fink

Dr. D. Preikszas